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Finding the Sweet Spot: Batch Selection for One-Class Active Learning

Finding the Sweet Spot: Batch Selection for One-Class Active Learning
Autor:

Adrian Englhardt, Holger Trittenbach, Dennis Vetter, Klemens Böhm

Quelle:

Proceedings of the 2020 SIAM International Conference on Data Mining (SDM), May 7-9, Cincinnati, Ohio, USA.